德國Langer-EMV近場天線型號如下:
Near Field Probe Set RF 1
Contents:
- H-Field Probe RF-R 3 - 2
- H-Field Probe RF-U 2,5 - 2
- H-Field Probe RF-K 7 - 4
- E-Field Probe RF-E 10
- Cable SMB-BNC
- Case 175 x 140 x 32 mm
- Short instruction
RF1近場探棒組包含磁場探頭和一個電場探針作為印刷電路板先期檢測驗的。主要用途於量測電路基板之模組,零件,線路...所產生之磁場與電場干擾。其使用方法主要是連接到頻譜分析儀或示波器，並允許測量磁場和電流所產生的干擾。
The RF 1 probe set contains magnetic field probes and an E-field probe for precompliance tests of printed circuit boards. Measuring the magnetic fields in the area of the module, conducting tracks, components and the modules of the supply system is the basis for selective measures to reduce disturbance emissions.
The passive probes are connected to the 50 Ohm input of a spectrum analyser or oscilloscope and allow comparative measurements of magnetic fields and disturbance currents in the frequency range from 30 MHz to 3 GHz.
All probes have an sheath current damping and are electrically screened.
Contents:
- H-Field Probe RF-R 400 - 1
- H-Field Probe RF-R 50 - 1
- H-Field Probe RF-U 5 - 2
- H-Field Probe RF-B 3 - 2
- Cable SMB-BNC
- Case 175 x 140 x 32 mm
- Short instruction
RF2 近場探棒組包含磁場探頭作為印刷電路板先期檢測驗的。主要用途於量測電路基板之模組,零件,線路...所產生之磁場與電場干擾。其使用方法主要是連接到頻譜分析儀或示波器，並允許測量磁場和電流所產生的干擾。
The RF 2 probe set contains magnetic field probes for precompliance tests of printed circuit boards. Measuring the magnetic fields in the area of the module, conducting tracks, components and the modules of the supply system is the basis for selective measures to reduce disturbance emissions.
The passive probes are connected to the 50 Ohm input of a spectrum analyser or oscilloscope and allow comparative measurements of magnetic fields and disturbance currents in the frequency range from 30 MHz to 3 GHz.
All probes have an sheath current damping and are electrically screened.
Near Field Probe Set RF 3 mini 
Contents:
- H-Field Probe RF-B 0,3 - 3
- H-Field Probe RF-R 0,3 - 3
- Cable SMB-BNC
- Case 175 x 140 x 32 mm
- Short instruction
RF3 mini 近場探棒組擁有特殊的微小電性隔離探頭,主要設計用於磁場量測,應用範圍包括電路佈局和零組件之部分。可以測量磁場的解析度為 1 mm 以下。其使用方法主要是連接到頻譜分析儀或示波器，並允許測量磁場和電流所產生的干擾。對於薄弱的範圍，建議使用20分貝前置放大器。所有探棒的探頭有一個很好的鞘電流阻尼和電性隔離。
The probes of the RF 3 mini set have special electrically screened miniature heads which are designed for detailed magnetic field measurements in the layout and component range. Magnetic fields can be measured with a resolution of under 1 millimeter for comparison purposes. The passive probes are connected to the 50 O input of a spectrum analyser or oscilloscope and facilitate comparison measurements of magnetic fields and disturbance currents in the frequency range from 30 MHz to 3 GHz. With weak fields, it is recommended to use the passive probes with the 20 dB pre-amplifier. All probes have an excellent sheath current damping and are electrically screened. The probe head is joined to the grip by a SMB plug-connector.
The MFA probes have been developed for measurements at the smallest SMD components (0603-0201) on printed circuit boards. Particularly fine conductor runs and SMD or IC pins can be measured. These near field micro probes help you localise EMC phenomena up to 6 GHz in electronic circuits and minimise interference emissions from the device. The probe voltage can be converted to the corresponding magnetic field or the current flowing through the conductor by means of the correction data.
The probes in the MFA01 set include special, electrically shielded active miniature heads which have been designed for detailed magnetic field measurements in the layout, on components and IC pins. The heads are embedded in a protective layer to protect them against damage.
A pre-amplifier stage is integrated in all of the MFA01 miniature measuring heads. The bias tee supplies the amplifier stage. It has to be connected at the 50 Ohm input of a spectrum analyser and its own power supply is via the system's plug-in power supply unit. The MFA probes, bias tee and cable all have SMA plug connectors.
Contents:
- Near Field Micro Probe MFA-R 0.2-6
- Near Field Micro Probe MFA-R 0.2-75
- Near Field Micro Probe MFA-K 0.1-12
- Bias-Tee BT706
- Power plug-in supply, type EU or US
- Cable SMA-SMA
- Case (340 x 240 x 55) mm
- Short instruction
MFA probe - optional:
- Near Field Micro Probe MFA-K 0,1-30
 
The near field probes type XF1 set have electrically shielded probe heads which are designed for special magnetic field measurements on electronic assemblies, components and IC pins.
The passive near field probes are connected to the 50 Ohm input of a spectrum analyser via SMA and allow comparative measurements of near fields and disturbance currents in the frequency range from 30 MHz to 6 GHz.
Contents:
- H-Field Probe XF-R 400 - 1
- H-Field Probe XF-R 3 - 1
- H-Field Probe XF-U 2.5 - 1
- H-Field Probe XF-B 3 - 1
- E-Field Probe XF-E 10
- Cable SMA-SMA
- Case (240 x 185 x 50) mm
- Short instruction
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